META: A Layout Based Tool to Estimate the Vulnerability of Digital Circuits to Multiple Event Transient-Reference-Cited by-同舟云学术

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META: A Layout Based Tool to Estimate the Vulnerability of Digital Circuits to Multiple Event Transient

Published:2022-06-19 Issue: Volume: Page:
ISSN:
Container-title:2022 20th IEEE Interregional NEWCAS Conference (NEWCAS)
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Author:

Bansal Vivek¹,Mohamed Otmane Ait¹,Nethula Sowmith¹

Affiliation:

1. Concordia University,Department of Electrical and Computer Engineering,Montreal,Canada

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/9841660/9841947/09842148.pdf?arnumber=9842148

Reference12 articles.

1. Soft error rate estimation of digital circuits in the presence of Multiple Event Transients (METs)

2. Estimation of single-event transient pulse characteristics for predictive analysis

3. A Layout-Based Soft Error Rate Estimation and Mitigation in the Presence of Multiple Transient Faults in Combinational Logic

4. A layout-based approach for multiple event transient analysis

5. Single event multiple transient (SEMT) measurements in 65 nm bulk technology

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1. Layout-based reliability analysis of openMSP430 register file under external radiations;2023 International Conference on Microelectronics (ICM);2023-12-17

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