The Effects of Neutron Energy and High-Z Materials on Single Event Upsets and Multiple Cell Upsets-Reference-Cited by-同舟云学术

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The Effects of Neutron Energy and High-Z Materials on Single Event Upsets and Multiple Cell Upsets

Published:2011-12 Issue:6 Volume:58 Page:2591-2598
ISSN:0018-9499
Container-title:IEEE Transactions on Nuclear Science
language:
Short-container-title:IEEE Trans. Nucl. Sci.

Author:

Clemens Michael Andrew,Sierawski Brian D.,Warren Kevin M.,Mendenhall Marcus H.,Dodds Nathaniel A.,Weller Robert A.,Reed Robert A.,Dodd Paul E.,Shaneyfelt Marty R.,Schwank James R.,Wender Stephen A.,Baumann Robert C.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Nuclear Energy and Engineering,Nuclear and High Energy Physics

Link

http://xplorestaging.ieee.org/ielx5/23/6093861/06068268.pdf?arnumber=6068268

Cited by 27 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Single-Event Upsets for Single-Port and Two-Port SRAM Cells at the 5-nm FinFET Technology;IEEE Transactions on Nuclear Science;2023-08

2. Study of Multicell Upsets in SRAM at a 5-nm Bulk FinFET Node;IEEE Transactions on Nuclear Science;2023-04

3. Effects of Collected Charge and Drain Area on SE Response of SRAMs at the 5-nm FinFET Node;2023 IEEE International Reliability Physics Symposium (IRPS);2023-03

4. Proton- and Neutron-Induced Single-Event Upsets in FPGAs for the PANDA Experiment;IEEE Transactions on Nuclear Science;2020-06

5. Possible atmospheric-like neutron beams at CSNS;Radiation Physics and Chemistry;2018-11

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