A DC Method to Extract Mobility Degradation and Series Resistance of Multifinger Microwave MOSFETs-Reference-Cited by-同舟云学术

A DC Method to Extract Mobility Degradation and Series Resistance of Multifinger Microwave MOSFETs

Published:2016-05 Issue:5 Volume:63 Page:1821-1826
ISSN:0018-9383
Container-title:IEEE Transactions on Electron Devices
language:
Short-container-title:IEEE Trans. Electron Devices

Author:

Sucre-Gonzalez Andrea,Zarate-Rincon Fabian,Ortiz-Conde Adelmo^ORCID,Torres-Torres Reydezel,Garcia-Sanchez Francisco J.,Muci Juan,Murphy-Arteaga Roberto S.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials

Link

http://xplorestaging.ieee.org/ielx7/16/7457179/07437412.pdf?arnumber=7437412

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4. Single Device MOSFET Series Resistance Extraction Methods: Comparison Between Newer and Older;2022 IEEE 34th International Conference on Microelectronic Test Structures (ICMTS);2022-03-21

5. A robust single device MOSFET series resistance extraction method considering horizontal-field-dependent mobility;Japanese Journal of Applied Physics;2022-02-10