An innovative Strategy to Quickly Grade Functional Test Programs
Author:
Affiliation:
1. Politecnico di Torino,Italy
2. STMicroelectronics,Italy
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/9983856/9983857/09983912.pdf?arnumber=9983912
Reference27 articles.
1. Infant Mortality--The Lesser Known Reliability Issue
2. Non-Intrusive Self-Test Library for Automotive Critical Applications: Constraints and Solutions
3. ATPG for Dynamic Burn-In Test in Full-Scan Circuits
4. Reducing burn-in time through high-voltage stress test and Weibull statistical analysis
5. Cache Resident Functional Microprocessor Testing: Avoiding High Speed IO Issues
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