Reducing burn-in time through high-voltage stress test and Weibull statistical analysis-Reference-Cited by-同舟云学术

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Reducing burn-in time through high-voltage stress test and Weibull statistical analysis

Published:2006-03 Issue:2 Volume:23 Page:88-98
ISSN:0740-7475
Container-title:IEEE Design & Test of Computers
language:
Short-container-title:IEEE Des. Test. Comput.

Author:

Zakaria M.F.,Kassim Z.A.,Ooi M.P.-L.,Demidenko S.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Hardware and Architecture,Software,Electrical and Electronic Engineering,Hardware and Architecture,Software

Link

http://xplorestaging.ieee.org/ielx5/54/33875/01613787.pdf?arnumber=1613787

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3. A Low-Cost Burn-In Tester Architecture to Supply Effective Electrical Stress;IEEE Transactions on Computers;2023-05-01

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5. A Toolchain to Quantify Burn-In Stress Effectiveness on Large Automotive System-on-Chips;IEEE Access;2023

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