Recent Trends and Perspectives on Defect-Oriented Testing
Author:
Affiliation:
1. Politecnico di Torino, IT
2. onsemi, BE
3. Technische Universiteit Delft, NL
4. STMicroelectronics, IT
5. Katholieke Universiteit Leuven, BE
6. Infineon Technologies, DE
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/9897157/9897171/09897647.pdf?arnumber=9897647
Reference38 articles.
1. Latent Defect Screening with Visually-Enhanced Dynamic Part Average Testing
2. Global and Local Process Variation Simulations in Design for Reliability approach
3. Compact Modelling of Resistive Switching Devices based on the Valence Change Mechanism
4. Complementary resistive switching behaviors evolved from bipolar TiN/HfO2/Pt device
5. Complementary Switching in Oxide-Based Bipolar Resistive-Switching Random Memory
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