Multi-transition delay test for improving the coverage of cell internal defects
Author:
Affiliation:
1. School of Microelectronics, Hefei University of Technology
Publisher
Institute of Electronics, Information and Communications Engineers (IEICE)
Link
https://www.jstage.jst.go.jp/article/elex/21/15/21_21.20240326/_pdf
Reference30 articles.
1. [1] P.G. Ryan, et al.: “Process defect trends and strategic test gaps,” 2014 International Test Conference (2014) 1 (DOI: 10.1109/TEST.2014.7035276).
2. [2] S. Pandey, et al.: “SAT-ATPG generated multi-pattern scan tests for cell internal defects: coverage analysis for resistive opens and shorts,” 2020 IEEE International Test Conference (ITC) (2020) 1 (DOI: 10.1109/ITC44778.2020.9325240).
3. [3] M. Hu, et al.: “Tightening the mesh size of the cell-aware ATPG net for catching all detectable weakest faults,” 2020 IEEE European Test Symposium (ETS) (2020) 1 (DOI: 10.1109/ETS48528.2020.9131567).
4. [4] A. Singh, et al.: “Silent data errors: sources, detection, and modeling,” 2023 IEEE 41st VLSI Test Symposium (VTS) (2023) 1 (DOI: 10.1109/VTS56346.2023.10139970).
5. [5] J. Shin, et al.: “A gate delay model considering temporal proximity of multiple input switching,” 2009 International SoC Design Conference (ISOCC) (2009) 577 (DOI: 10.1109/SOCDC.2009.5423815).
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