Latent Defect Screening with Visually-Enhanced Dynamic Part Average Testing
Author:
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/9125440/9131553/09131593.pdf?arnumber=9131593
Cited by 5 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
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4. Recent Trends and Perspectives on Defect-Oriented Testing;2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design (IOLTS);2022-09-12
5. Testing Technologies for Analog/Mixed-Signal Circuits in IoT Era;IEEJ Transactions on Electronics, Information and Systems;2021-01-01
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