Density-oriented diagnostic data compression strategy for characterization of embedded memories in Automotive Systems-on-Chip
Author:
Affiliation:
1. Politecnico di Torino,Dipartimento di Automatica e Informatica,Italy
2. INFINEON Technologies,Germany and Italy
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/10173930/10173940/10174126.pdf?arnumber=10174126
Reference11 articles.
1. A programmable memory BIST for embedded memory
2. Processor-programmable memory BIST for bus-connected embedded memories;wu;Proc of the Design Automation Conference,2001
3. Test response compression and bitmap encoding for embedded memories in manufacturing process monitoring
4. Controller Architecture for Memory BIST Algorithms;abhas;IEEE International Students’ Conference on Electrical Electronics and Computer Science (SCEECS),2020
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1. PA-2SBF: Pattern-Adaptive Two-Stage Bloom Filter for Run-Time Memory Diagnostic Data Compression in Automotive SoCs;2024 Design, Automation & Test in Europe Conference & Exhibition (DATE);2024-03-25
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