An interlaboratory study of the reproducibility of on-wafer S-parameter measurements from 140 GHz to 220 GHz-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

An interlaboratory study of the reproducibility of on-wafer S-parameter measurements from 140 GHz to 220 GHz

Published:2020-01 Issue: Volume: Page:
ISSN:
Container-title:2020 94th ARFTG Microwave Measurement Symposium (ARFTG)
language:
Short-container-title:

Author:

Clarke Roland G.¹,Shang Xiaobang²,Ridler Nick M.²,Lozar Roger³,Probst Thorsten⁴,Arz Uwe⁴

Affiliation:

1. University of Leeds,UK

2. National Physical Laboratory,UK

3. Fraunhofer-Gesellschaft IAF,Germany

4. Physikalisch-Technische Bundesanstalt,Germany

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/9062345/9071644/09071783.pdf?arnumber=9071783

Cited by 5 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Some Recent Advances in Measurements at Millimeter-Wave and Terahertz Frequencies: Advances in High Frequency Measurements;IEEE Microwave Magazine;2024-01

2. Interlaboratory Investigation of On-wafer S-parameter Measurements from 110 GHz to 1.1 THz;2023 53rd European Microwave Conference (EuMC);2023-09-19

3. D-Band Characterization of a Commercial High-Resistivity Silicon Calibration Substrate;2023 101st ARFTG Microwave Measurement Conference (ARFTG);2023-06-16

4. A Differential Broadband Single-Sweep 70 kHz-220 GHz Wafer-Level System: First Calibration and Measurement Characteristics;2023 100th ARFTG Microwave Measurement Conference (ARFTG);2023-01-22

5. Inter-Laboratory Comparison of On-Wafer Broadband 70kHz-220GHz Single-Sweep Measurements;2021 51st European Microwave Conference (EuMC);2022-04-04

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP