Interlaboratory Investigation of On-wafer S-parameter Measurements from 110 GHz to 1.1 THz-Reference-Cited by-同舟云学术

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Interlaboratory Investigation of On-wafer S-parameter Measurements from 110 GHz to 1.1 THz

Published:2023-09-19 Issue: Volume: Page:
ISSN:
Container-title:2023 53rd European Microwave Conference (EuMC)
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Author:

Shang Xiaobang¹,Ridler Nick¹,Arz Uwe²,Phung Gia Ngoc²,Roch-Jeune Isabelle³,Ducournau Guillaume³,Haddadi Kamel³,Flisgen Thomas⁴,Doerner Ralf⁴,Allal Djamel⁵,Jayasankar Divya⁶,Stake Jan⁶,Schmidt Robin⁷,Fisher Gavin⁸,Mubarak Faisal⁹

Affiliation:

1. National Physical Laboratory (NPL),UK

2. Physikalisch-Technische Bundesanstalt (PTB),Germany

3. Université de Lille,IEMN UMR 8520 CNRS,France

4. Ferdinand-Braun-Institut gGmbH (FBH),Germany

5. Laboratoire National de métrologie et d’essais (LNE),France

6. Chalmers University of Technology,Sweden

7. Keysight,Belgium

8. FormFactor GmbH,Germany

9. National Metrology Institute of The Netherlands (VSL),The Netherlands

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/10290132/10289699/10290550.pdf?arnumber=10290550

Reference17 articles.

1. A Comparative Study of On-Wafer and Waveguide Module S-Parameter Measurements at D-Band Frequencies

2. On-Wafer Characterization of Silicon Transistors Up To 500 GHz and Analysis of Measurement Discontinuities Between the Frequency Bands

3. Crosstalk Corrections for Coplanar-Waveguide Scattering-Parameter Calibrations

4. Anomalies in multiline-TRL-corrected measurements of short CPW lines

5. Minimizing discontinuities in wafer-level sub-THz measurements up to 750 GHz for device modelling applications

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. On-Wafer Capacitor Characterization Including Uncertainty Estimates Up to 1.0 THz;IEEE Transactions on Terahertz Science and Technology;2024-09

2. Exploring Nanorobotics Integration with Microwave and Millimeter-Wave Techniques for Advanced On-wafer Measurement;2024 5th International Conference in Electronic Engineering, Information Technology & Education (EEITE);2024-05-29

3. A 0.1 GHz to 1.1 THz Inverted Grounded-CPW mTRL Calibration Kit Characterization in an InP HBT Process;2024 IEEE Wireless and Microwave Technology Conference (WAMICON);2024-04-15

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