Some Recent Advances in Measurements at Millimeter-Wave and Terahertz Frequencies: Advances in High Frequency Measurements-Reference-Cited by-同舟云学术

Some Recent Advances in Measurements at Millimeter-Wave and Terahertz Frequencies: Advances in High Frequency Measurements

Published:2024-01 Issue:1 Volume:25 Page:58-71
ISSN:1527-3342
Container-title:IEEE Microwave Magazine
language:
Short-container-title:IEEE Microwave

Author:

Shang Xiaobang¹^ORCID,Ridler Nick¹^ORCID,Stokes Daniel¹^ORCID,Skinner James¹^ORCID,Mubarak Faisal²^ORCID,Arz Uwe³^ORCID,Phung Gia Ngoc³^ORCID,Kuhlmann Karsten³^ORCID,Kazemipour Alireza⁴^ORCID,Hudlička Martin⁵^ORCID,Ziade François⁶^ORCID

Affiliation:

1. National Physical Laboratory, Teddington, U.K.

2. VSL-Dutch Metrology Institute, Delft, The Netherlands

3. Physikalisch Technische, Bundesanstalt, Germany

4. Eidgenössisches Institut für Metrologie (METAS), Switzerland

5. Czech Metrology Institute, Prague, Czech Republic

6. Laboratoire National de Métrologie et d’Essais, Trappes, France

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,Radiation

Link

http://xplorestaging.ieee.org/ielx7/6668/10345389/10345416.pdf?arnumber=10345416

Reference64 articles.

1. The Trace Is on Measurements: Developing Traceability for S?Parameter Measurements at Millimeter and Submillimeter Wavelengths

2. VNA calibration

3. Traceability to national standards for S-parameter measurements of devices fitted with precision 1.85 mm coaxial connectors

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