Inter-Laboratory Comparison of On-Wafer Broadband 70kHz-220GHz Single-Sweep Measurements
Author:
Affiliation:
1. MPI Corporation,Taiwan
2. Ferdinand-Braun-Institut gGmbH (FBH), Leibniz-Institut für Höchstfrequenztechnik,Germany
3. Anritsu,Morgan Hill,CA,USA
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/9784154/9783612/09784277.pdf?arnumber=9784277
Reference8 articles.
1. A bilateral comparison of on-wafer S-parameter measurements at millimeter wavelengths
2. Calibration Substrate Design for Accurate mm-Wave Probe-Tip Calibration
3. Traceable Coplanar Waveguide Calibrations on Fused Silica Substrates up to 110 GHz
4. An interlaboratory study of the reproducibility of on-wafer S-parameter measurements from 140 GHz to 220 GHz
Cited by 3 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. A New Calibration Technique of Electromagnetic Simulators for Accurate Analyses of Microwave Components on Epitaxial Wafers;IEEE Access;2024
2. Interlaboratory Investigation of On-wafer S-parameter Measurements from 110 GHz to 1.1 THz;2023 53rd European Microwave Conference (EuMC);2023-09-19
3. A Differential Broadband Single-Sweep 70 kHz-220 GHz Wafer-Level System: First Calibration and Measurement Characteristics;2023 100th ARFTG Microwave Measurement Conference (ARFTG);2023-01-22
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