Design Considerations of an SRAM Array for the Statistical Validation of Time-Dependent Variability Models-Reference-Cited by-同舟云学术

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Design Considerations of an SRAM Array for the Statistical Validation of Time-Dependent Variability Models

Published:2018-07 Issue: Volume: Page:
ISSN:
Container-title:2018 15th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD)
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Author:

Saraza-Canflanca P.,Rodriguez R.,Nafria M.,Fernandez F.V.,Malagon D.,Passos F.,Toro A.,Nunez J.,Diaz-Fortuny J.,Castro-Lopez R.,Roca E.,Martin-Martinez J.

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/8410988/8434559/08434900.pdf?arnumber=8434900

Cited by 5 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Reliability improvement of SRAM PUFs based on a detailed experimental study into the stochastic effects of aging;AEU - International Journal of Electronics and Communications;2024-03

2. A DRV-based bit selection method for SRAM PUF key generation and its impact on ECCs;Integration;2022-07

3. A Smart SRAM-Cell Array for the Experimental Study of Variability Phenomena in CMOS Technologies;2022 IEEE International Reliability Physics Symposium (IRPS);2022-03

4. A Ring-Oscillator-Based Degradation Monitor Concept with Tamper Detection Capability;2022 IEEE International Reliability Physics Symposium (IRPS);2022-03

5. Improving the reliability of SRAM-based PUFs under varying operation conditions and aging degradation;Microelectronics Reliability;2021-03

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