A DRV-based bit selection method for SRAM PUF key generation and its impact on ECCs

Author:

Santana-Andreo A.,Saraza-Canflanca P.,Carrasco-Lopez H.,Brox P.,Castro-Lopez R.,Roca E.,Fernandez F.V.

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Hardware and Architecture,Software

Reference24 articles.

1. Physical unclonable functions;Gao;Nat. Electron.,2020

2. A PUF taxonomy;McGrath;Appl. Phys. Rev.,2019

3. A technique to build a secret key in integrated circuits for identification and authentication applications;Lee,2004

4. Silicon physical random functions;Gassend,2002

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1. Analyzing Aging Effects on SRAM PUFs: Implications for Security and Reliability;Journal of Hardware and Systems Security;2024-07-27

2. Reliability improvement of SRAM PUFs based on a detailed experimental study into the stochastic effects of aging;AEU - International Journal of Electronics and Communications;2024-03

3. A detailed, cell-by-cell look into the effects of aging on an SRAM PUF using a specialized test array;2023 19th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD);2023-07-03

4. ProHys PUF: A Proteresis - Hysteresis switch based Physical Unclonable Function;Integration;2023-03

5. A novel Physical Unclonable Function using RTN;2022 IEEE International Symposium on Circuits and Systems (ISCAS);2022-05-28

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