A Ring-Oscillator-Based Degradation Monitor Concept with Tamper Detection Capability
Author:
Affiliation:
1. imec,Leuven,Belgium,3001
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/9764406/9764408/09764609.pdf?arnumber=9764609
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5. Array-Based Statistical Characterization of CMOS Degradation Modes and Modeling of the Time-Dependent Variability Induced by Different Stress Patterns in the $\{\boldsymbol{V_{G}}, \boldsymbol{V_{D}}\}$ bias space
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4. Modeling Analysis of BTI-Driven Degradation of a Ring Oscillator Designed in a 28-nm CMOS Technology;IEEE Transactions on Device and Materials Reliability;2023-09
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