Author:
Ryan P.G.,Fuchs W.K.,Pomeranz I.
Cited by
27 articles.
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1. Dummy Faulty Units for Reduced Fail Data Volume From Logic Faults;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2023-11
2. Partially-Specified Output Response for Reduced Fail Data Volume;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2022
3. Hybrid Pass/Fail and Full Fail Data for Reduced Fail Data Volume;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2021-08
4. Logic Diagnosis with Hybrid Fail Data;ACM Transactions on Design Automation of Electronic Systems;2021-05-31
5. On-Chip Diagnosis of Generalized Delay Failures Using Compact Fault Dictionaries;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2019-02