On-Chip Diagnosis of Generalized Delay Failures Using Compact Fault Dictionaries
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Published:2019-02
Issue:2
Volume:38
Page:322-334
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ISSN:0278-0070
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Container-title:IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
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language:
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Short-container-title:IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst.
Author:
Beckler Matthew LayneORCID,
Blanton R. D.ORCID
Funder
Semiconductor Research Corporation
National Science Foundation
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Computer Graphics and Computer-Aided Design,Software