Author:
Maly W.,Heineken H.,Khare J.,Nag P.K.
Cited by
12 articles.
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1. Physically-Aware Diagnostic Resolution;2014 IEEE 23rd Asian Test Symposium;2014-11
2. Performance and manufacturability trade-offs of pattern minimization for sub-22nm technology nodes;SPIE Proceedings;2011-03-17
3. Yield Estimation by Computing Probabilistic Hypervolumes;Extreme Statistics in Nanoscale Memory Design;2010
4. Track Routing and Optimization for Yield;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2008-05
5. Statistical Performance Modeling and Optimization;Foundations and Trends® in Electronic Design Automation;2006