Author:
Porche John A.,Blanton R.D. Shawn
Cited by
2 articles.
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1. A Repair-for-Diagnosis Methodology for Logic Circuits;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2018-11
2. PADLOC: Physically-Aware Defect Localization and Characterization;2017 IEEE 26th Asian Test Symposium (ATS);2017-11