Funder
Taiwan Semiconductor Manufacturing Corporation
National Science Council of Taiwan
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Hardware and Architecture,Software
Cited by
1 articles.
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1. Design and Simulation of Fault Tolerances in Combinational Circuits Using CMOS 45nm Technology;2023 Second International Conference on Electrical, Electronics, Information and Communication Technologies (ICEEICT);2023-04-05