Author:
Gu Chenjie,Roychowdhury Jaijeet
Reference53 articles.
1. Nassif SR (2001) Modeling and analysis of manufacturing variations. In Proceedings of the IEEE conference on custom integrated circuits, 6–9 May 2001, pp 223–228
2. Papoulis A (1984) Probability, random variables, and stochastic processes. Mc-Graw Hill, New York
3. The International Technology Roadmap for Semiconductors (2008) http://www.itrs.net/
4. Maly W, Heineken H, Khare J, Nag PK (1996) Design for manufacturability in submicron domain. In Proceedings of the IEEE/ACM international conference on computer-aided design ICCAD-96. Digest of Technical Papers, 10–14 November 1996, pp 690–697
5. Gupta P, Kahng AB (2003) Manufacturing-aware physical design. In Proceedings of the ICCAD-2003 computer aided design international conference, 9–13 November 2003, pp 681–687
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