Comprehensive Analysis of RF Hot-Carrier Reliability Sensitivity and Design Explorations for 28GHz Power Amplifier Applications
Author:
Affiliation:
1. STMicroelectronics,Crolles,France,38926
2. Université Grenoble Alpes,CEA-LETI,Grenoble,France,F-38000
3. Univ. Grenoble Alpes,RFIC-Lab,Grenoble,France,38000
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/9764406/9764408/09764535.pdf?arnumber=9764535
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