Author:
Chakrabarti S.,Cherubal S.,Chatterjee A.
Cited by
11 articles.
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1. Machine Learning Support for Diagnosis of Analog Circuits;Machine Learning Support for Fault Diagnosis of System-on-Chip;2022-10-22
2. A Fast Algorithm for Testability Analysis of Large Linear Time-Invariant Networks;IEEE Transactions on Circuits and Systems I: Regular Papers;2017-06
3. Automatic parametric fault detection in complex analog systems based on a method of minimum node selection;International Journal of Applied Mathematics and Computer Science;2016-09-01
4. Analog and Mixed-Signal Test;Electronic Design Automation for IC System Design, Verification, and Testing;2016-04-14
5. An unconditionally sound algorithm for testability analysis in linear time-invariant electrical networks;International Journal of Circuit Theory and Applications;2015-11-02