Automatic parametric fault detection in complex analog systems based on a method of minimum node selection-Reference-Cited by-同舟云学术

Automatic parametric fault detection in complex analog systems based on a method of minimum node selection

Published:2016-09-01 Issue:3 Volume:26 Page:655-668
ISSN:2083-8492
Container-title:International Journal of Applied Mathematics and Computer Science
language:en
Short-container-title:

Author:

Bilski Adrian¹,Wojciechowski Jacek²

Affiliation:

1. Faculty of Applied Informatics and Mathematics, Warsaw University of Life Sciences—SGGW, ul. Nowoursynowska 159, 02-776 Warsaw, Poland

2. Institute of Radioelectronics, Warsaw University of Technology, ul. Nowowiejska 15/19, 00-665 Warsaw, Poland

Abstract

Abstract The aim of this paper is to introduce a strategy to find a minimal set of test nodes for diagnostics of complex analog systems with single parametric faults using the support vector machine (SVM) classifier as a fault locator. The results of diagnostics of a video amplifier and a low-pass filter using tabu search along with genetic algorithms (GAs) as node selectors in conjunction with the SVM fault classifier are presented. General principles of the diagnostic procedure are first introduced, and then the proposed approach is discussed in detail. Diagnostic results confirm the usefulness of the method and its computational requirements. Conclusions on its wider applicability are provided as well.

Publisher

Walter de Gruyter GmbH

Subject

Applied Mathematics,Engineering (miscellaneous),Computer Science (miscellaneous)

Reference46 articles.

1. Aminian, F. and Modular, A.(2007). Fault-diagnostic system for analog electronic circuit using neural networks with wavelet transform as a preprocessor, IEEE Transactions on Instrumentation and Measurement56(5): 1546–1554.

2. Arabas, J. (2004). Lectures in Evolutionary Algorithms, WNT, Warsaw, (in Polish).

3. Bilski, A. (2013). Diagnostic of complex analog systems with parametric faults using support vector machines, in T. Kwater and B. Twaróg (Eds.), Computing in Science and Technology 2012/13, University of Rzeszow, Rzeszów, pp. 7–24.

4. Bilski, P. (2007). Automated diagnostic system using graph clustering algorithm and fuzzy logic method, 18th European Conference on Circuit Theory and Design 2007, Seville, Spain, pp. 779–782.

5. Bilski, P. (2011). Automated selection of kernel parameters in diagnostics of analog systems, Przegląd Elektrotechniczny87(5): 9–13.

Cited by 9 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Soft fault diagnosis in linear circuits: Test selection and non-iterative identification procedure;Measurement;2023-08

2. Test Node Selection for Fault Diagnosis in Analog Circuits using Faster RCNN Model;Circuits, Systems, and Signal Processing;2023-01-23

3. A dual mode self-test for a stand alone AES core;PLOS ONE;2021-12-23

4. On the Construction of Neuromorphic Fault Dictionaries for Analog Integrated Circuits;Russian Microelectronics;2019-09

5. Automatic Parametric Fault Detection in Complex Microwave Filter Using SVM and PCA;Advances in Intelligent Systems and Computing;2019