An unconditionally sound algorithm for testability analysis in linear time-invariant electrical networks

Author:

Fontana G.1,Luchetta A.1,Manetti S.1,Piccirilli M. C.1

Affiliation:

1. Department of Information Engineering; University of Florence; via di S. Marta 3 50139 Florence Italy

Publisher

Wiley

Subject

Applied Mathematics,Electrical and Electronic Engineering,Computer Science Applications,Electronic, Optical and Magnetic Materials

Reference31 articles.

1. Global and local parametric diagnosis of analog short-channel CMOS circuits using homotopy-simplicial algorithm;Tadeusiewicz;International Journal of Circuit Theory and Applications,2014

2. Multiple catastrophic fault diagnosis of analog circuits considering the component tolerances;Tadeusiewicz;International Journal of Circuit Theory and Applications,2012

3. Diagnosis of local spot defects in analog circuits;Huang;IEEE Transactions on Instrumentation and Measurement,2012

4. A method for fault diagnosis in linear electronic circuits;Tadeusiewicz;International Journal of Circuit Theory and Applications,2000

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