Finite Element Supported Data Augmentation for a Deep Learning Driven Intelligent Failure Analysis System Based on Infrared Thermography-Reference-Cited by-同舟云学术

Finite Element Supported Data Augmentation for a Deep Learning Driven Intelligent Failure Analysis System Based on Infrared Thermography

Published:2022-04-25 Issue: Volume: Page:
ISSN:
Container-title:2022 23rd International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE)
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Author:

Pareek Kaushal Arun¹,May Daniel¹,Meszmer Peter¹,Ras Mohamad Abo²,Wunderle Bernhard¹

Affiliation:

1. Chemnitz University of Technology,Chemnitz,Germany

2. Berliner Nanotest und Design GmbH,Berlin,Germany

Funder

European Social Fund

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/9758836/9758837/09758902.pdf?arnumber=9758902

Reference18 articles.

1. Transiente Methoden der Infrarot-Thermografie zur zerstörungsfreien Fehleranalytik in der mikroelektronischen Aufbau-und Verbindungstechnik;may;PhD thesis,2015

2. Pulsed surface heating of a semi-infinite solid

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