AI-assisted Design for Reliability: Review and Perspectives-Reference-Cited by-同舟云学术

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AI-assisted Design for Reliability: Review and Perspectives

Published:2024-04-07 Issue: Volume: Page:1-12
ISSN:
Container-title:2024 25th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE)
language:
Short-container-title:

Author:

Yuan Cadmus¹,M de Jong S. D.²,Driel Willem D. van²

Affiliation:

1. Feng Chia University, Taichung, Taiwan No. 100, Wenhwa Rd., Seatwen, Taichung,Department of Mechanical and Computer-aided Engineering,Taiwan,R.O.C,40724

2. Delft University of Technology, Delft, Netherlands Mekelweg 4, 2628 CD,Department of Microelectronics,Delft,Netherlands

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/10491281/10491408/10491447.pdf?arnumber=10491447

Reference89 articles.

1. Deep Independent Recurrent Neural Network Technique for Modeling Transient Behavior of Nonlinear Circuits

2. Performance prediction of current-voltage characteristics of Schottky diodes at low temperatures using artificial intelligence

3. Reinforcement learning to reduce failures in SOT-MRAM switching

4. Reinforcement-Learning-Based Signal Integrity Optimization and Analysis of a Scalable 3-D X-Point Array Structure

5. Extrapolation With Range Determination of 2-D Spectral Transposed Convolutional Neural Network for Advanced Packaging Problems

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