Anomaly Detection in Batch Manufacturing Processes Using Localized Reconstruction Errors From 1-D Convolutional AutoEncoders
Author:
Affiliation:
1. Intelligent Systems Research Centre, School of Computing, Engineering and Intelligent Systems, Ulster University, Londonderry, U.K.
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Industrial and Manufacturing Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Link
http://xplorestaging.ieee.org/ielx7/66/10036056/09925612.pdf?arnumber=9925612
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1. Integrated Autoencoder-Level Set Method Outperforms Autoencoder for Novelty Detection
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2. Evaluation on Semiconductor Manufacturing Reconfiguration and Production Based on Scheduling Integrated Optimization Algorithm;2023 IEEE 15th International Conference on Computational Intelligence and Communication Networks (CICN);2023-12-22
3. Convolutional AutoEncoders for Anomaly Detection in Semiconductor Manufacturing;2023 31st Irish Conference on Artificial Intelligence and Cognitive Science (AICS);2023-12-07
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