DRAM technology perspective for gigabit era

Author:

Kinam Kim ,Chang-Gyu Hwang ,Jong Gil Lee

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials

Cited by 116 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

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4. Enhanced DRAM Single Bit Characteristics from Process Control of Chlorine;2023 IEEE International Reliability Physics Symposium (IRPS);2023-03

5. Analysis of Intermittent Single-bit Failure on 10-nm node generation DRAM Devices;2023 IEEE International Reliability Physics Symposium (IRPS);2023-03

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