Author:
Azais F.,Bertrand Y.,Renovell M.,Ivanov A.,Tabatabaei S.
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Hardware and Architecture,Software,Electrical and Electronic Engineering,Hardware and Architecture,Software
Cited by
20 articles.
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1. Fault-based Built-in Self-test and Evaluation of Phase Locked Loops;ACM Transactions on Design Automation of Electronic Systems;2021-05-31
2. Model-Free Testing of Analog Circuits;2016 IEEE 25th Asian Test Symposium (ATS);2016-11
3. Built‐in self‐test structure for fault detection of charge‐pump phase‐locked loop;IET Circuits, Devices & Systems;2016-07
4. Analog and Mixed-Signal Test;Electronic Design Automation for IC System Design, Verification, and Testing;2016-04-14
5. Application of Neural Network for Testing Voltage-Controlled Oscillators;IFAC-PapersOnLine;2016