Author:
Chiu Geng-Ming,Li James Chien-Mo
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Hardware and Architecture,Software
Cited by
41 articles.
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1. On Evaluating Test Response Obfuscation and Encryption Countermeasures;2024 IEEE 30th International Symposium on On-Line Testing and Robust System Design (IOLTS);2024-07-03
2. SASL-JTAG: A Light-Weight Dependable JTAG;2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT);2023-10-03
3. A Survey of Chips Security Technology Based on Scan Chain;2023 International Symposium of Electronics Design Automation (ISEDA);2023-05-08
4. A Low-overhead PUF-based Secure Scan Design;2023 24th International Symposium on Quality Electronic Design (ISQED);2023-04-05
5. Power Analysis Attack on Locking SIB based IJTAG Achitecture;2022 IFIP/IEEE 30th International Conference on Very Large Scale Integration (VLSI-SoC);2022-10-03