On Evaluating Test Response Obfuscation and Encryption Countermeasures
Author:
Affiliation:
1. IIT Jammu,Dept. of EE,India
2. IIT Jammu,Dept. of CSE,India
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx8/10616000/10616049/10616066.pdf?arnumber=10616066
Reference14 articles.
1. Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits
2. Scan based side channel attack on dedicated hardware implementations of Data Encryption Standard
3. Secure scan: a design-for-test architecture for crypto chips
4. Scan-Based Side-Channel Attack against RSA Cryptosystems Using Scan Signatures
5. Scan-based attack against elliptic curve cryptosystems
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