A Low-overhead PUF-based Secure Scan Design-Reference-Cited by-同舟云学术

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A Low-overhead PUF-based Secure Scan Design

Published:2023-04-05 Issue: Volume: Page:
ISSN:
Container-title:2023 24th International Symposium on Quality Electronic Design (ISQED)
language:
Short-container-title:

Author:

Zhou Wei¹,Cui Aijiao¹,Chen Cassi²,Qu Gang³

Affiliation:

1. Harbin Institute of Technology (Shenzhen),School of Electronic and Information Engineering,Guangdong,China

2. University of California,Berkeley,USA

3. Univ. of Maryland,Dept. of Electrical and Computer Engineering and Institute of Systems Research,College Park,USA

Funder

National Natural Science Foundation of China

Advanced Research Projects Agency

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/10129281/10129282/10129349.pdf?arnumber=10129349

Reference23 articles.

1. Scan chain encryption for the test, diagnosis and debug of secure circuits

2. Securing Designs against Scan-Based Side-Channel Attacks

3. State dependent scan flip-flop with key-based configuration against scan-based side channel attack on RSA circuit

4. Secure Scan and Test Using Obfuscation Throughout Supply Chain

5. A New PUF Based Lock and Key Solution for Secure In-Field Testing of Cryptographic Chips

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. A secure scan architecture using dynamic key to thwart scan-based side-channel attacks;Microelectronics Journal;2024-01

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