Author:
Lee J.,Tehranipoor M.,Patel C.,Plusquellic J.
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering
Cited by
109 articles.
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1. DefScan: Provably Defeating Scan Attack on AES-Like Ciphers;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2024-08
2. On Evaluating Test Response Obfuscation and Encryption Countermeasures;2024 IEEE 30th International Symposium on On-Line Testing and Robust System Design (IOLTS);2024-07-03
3. DOSCrack: Deobfuscation Using Oracle-Guided Symbolic Execution and Clustering of Binary Security Keys;2024 IEEE International Symposium on Hardware Oriented Security and Trust (HOST);2024-05-06
4. SRIL: Securing Registers from Information Leakage at Register Transfer Level;2024 37th International Conference on VLSI Design and 2024 23rd International Conference on Embedded Systems (VLSID);2024-01-06
5. A secure scan architecture using dynamic key to thwart scan-based side-channel attacks;Microelectronics Journal;2024-01