SiO/sub 2/ interface layer effects on microwave loss of high-resistivity CPW line-Reference-Cited by-同舟云学术

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SiO/sub 2/ interface layer effects on microwave loss of high-resistivity CPW line

Published:1999 Issue:1 Volume:9 Page:10-12
ISSN:1051-8207
Container-title:IEEE Microwave and Guided Wave Letters
language:
Short-container-title:IEEE Microw. Guid. Wave Lett.

Author:

Yunhong Wu ,Gamble S.,Armstrong B.M.,Fusco V.F.,Stewart J.A.C.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

General Physics and Astronomy,General Engineering

Link

http://xplorestaging.ieee.org/ielx4/75/16241/00752108.pdf?arnumber=752108

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