Degradation mechanism for photon transfer curve of CMOS image sensor after irradiation-Reference-Cited by-同舟云学术

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Degradation mechanism for photon transfer curve of CMOS image sensor after irradiation

Published:2017 Issue:10 Volume:25 Page:2676-2681
ISSN:1004-924X
Container-title:Optics and Precision Engineering
language:en
Short-container-title:光学精密工程

Author:

FENG Jie 冯婕,LI Yu-dong 李豫东,WEN Lin 文林,ZHOU Dong 周东,MA Lin-dong 马林东

Publisher

Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences

Subject

Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Research on the degradation of resolution in cameras based on CMOS image sensor under γ- and X-rays irradiation;Radiation Effects and Defects in Solids;2024-08-19

2. 不同能量质子辐照诱发CCD图像传感器性能退化实验与分析;Acta Optica Sinica;2023

3. Failure Mode, Mechanism, and Effect Analysis of Visible Light Camera in an Optoelectronic Pod;2022 13th International Conference on Reliability, Maintainability, and Safety (ICRMS);2022-08-21

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