Research on the degradation of resolution in cameras based on CMOS image sensor under γ- and X-rays irradiation-Reference-Cited by-同舟云学术

Research on the degradation of resolution in cameras based on CMOS image sensor under γ- and X-rays irradiation

Published:2024-08-19 Issue: Volume: Page:1-11
ISSN:1042-0150
Container-title:Radiation Effects and Defects in Solids
language:en
Short-container-title:Radiation Effects and Defects in Solids

Author:

Feng Jie¹²,Li Kunfang¹²³,Li Yudong¹²,Liu Bingkai¹²,Wen Lin¹²,Guo Qi¹²

Affiliation:

1. Xinjiang Technical Institute of Physics and Chemistry, Chinese Academy of Sciences, Urumqi, People’s Republic of China

2. Xinjiang Key Laboratory of Extreme Environment Electronics, Urumqi, People’s Republic of China

3. University of Chinese Academy of Sciences, Beijing, People’s Republic of China

Funder

National Natural Science Foundation of China

West Light Talent Training Plan of the Chinese Academy of Sciences

Youth Science and Technology Talents Project of Xinjiang Uygur Autonomous

Outstanding Youth Fund of Xinjiang Natural Science Foundation

Publisher

Informa UK Limited

Link

https://www.tandfonline.com/doi/pdf/10.1080/10420150.2024.2391768

Reference21 articles.

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5. Displacement Damage Effects Due to Neutron and Proton Irradiations on CMOS Image Sensors Manufactured in Deep Submicron Technology;Virmontois C.;IEEE Trans. Nucl. Sci.,2010