Failure Mode, Mechanism, and Effect Analysis of Visible Light Camera in an Optoelectronic Pod
Author:
Affiliation:
1. The Hong Kong Polytechnic University,Department of Industrial and Systems Engineering,Hong Kong,China
2. School of Mechanical and Electrical Engineering, School of University of Electronic Science and Technology of China,Chengdu,China
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/9944388/9944547/09944558.pdf?arnumber=9944558
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4. Degradation mechanism for photon transfer curve of CMOS image sensor after irradiation;fen;Optics and Precision Engineering,2017
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