Failure Mode, Mechanism, and Effect Analysis of Visible Light Camera in an Optoelectronic Pod

Author:

Huang Ruishu1,Zeng Ying2

Affiliation:

1. The Hong Kong Polytechnic University,Department of Industrial and Systems Engineering,Hong Kong,China

2. School of Mechanical and Electrical Engineering, School of University of Electronic Science and Technology of China,Chengdu,China

Publisher

IEEE

Reference12 articles.

1. CMOS image sensors

2. Ship Target Recognition and Positioning Based on Aerial Photos;xuan;2021 33rd Chinese Control and Decision Conference (CCDC),0

3. The Research on Fault Diagnosis Technique on Main Control Panel of Aero camera;li;Journal of Changchun University of Science and Technology (Natural Science Edition),2008

4. Degradation mechanism for photon transfer curve of CMOS image sensor after irradiation;fen;Optics and Precision Engineering,2017

5. Reliability Optimal Design of Aerospace Image Sensor Circuit System;zeng;Science Technology and Engineering,2012

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号  京ICP备18003416号-3