4H-SiC P+N UV Photodiodes for Space Applications
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Published:2015-06
Issue:
Volume:821-823
Page:644-647
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ISSN:1662-9752
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Container-title:Materials Science Forum
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language:
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Short-container-title:MSF
Author:
Berenguier B.1, Ottaviani Laurent1, Biondo Stéphane1, Lazar Mihai2, Milesi Frédéric3, Palais Olivier1, Torregrosa Frank4, Lyoussi A.5, Kalinina Evgenia4, Lebedev A.4
Affiliation:
1. Aix-Marseille University 2. Université de Lyon 3. CEA-LETI 4. Ion Beam Services 5. Laboratoire Dosimétrie Capteurs Instrumentation
Abstract
Spectral sensitivity measurements versus temperature have been carried out on irradiated SiC p+n photodiodes, fabricated using two different doping processes: Aluminium standard implantation and Boron plasma immersion ion implantation. The spectral sensitivity of Al doped photodiodes increase for incident wavelength higher than 270 nm, and are very stable below. Boron doped irradiated photodiodes show a general increase of the photoresponse for all wavelengths. In both cases, an hysteresis effect is observable when with the temperature. Results are presented and discussed.
Publisher
Trans Tech Publications, Ltd.
Subject
Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science
Reference9 articles.
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