Construction of Independently Driven Double-Tip Scanning Tunneling Microscope-Reference-Cited by-同舟云学术

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Construction of Independently Driven Double-Tip Scanning Tunneling Microscope

Published:2004-12-24 Issue:3 Volume:44 Page:L120-L122
ISSN:0021-4922
Container-title:Japanese Journal of Applied Physics
language:en
Short-container-title:Jpn. J. Appl. Phys.

Author:

Takami Kazuhiro,Akai-Kasaya Megumi,Saito Akira,Aono Masakazu,Kuwahara Yuji

Publisher

IOP Publishing

Subject

General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering

Cited by 43 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

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3. Invited Review Article: Multi-tip scanning tunneling microscopy: Experimental techniques and data analysis;Review of Scientific Instruments;2018-10

4. Multiple-Probe Scanning Probe Microscope;Compendium of Surface and Interface Analysis;2018

5. Multiprobe Electrical Measurements without Optical Interference;Conductive Atomic Force Microscopy;2017-08-16

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