Invited Review Article: Multi-tip scanning tunneling microscopy: Experimental techniques and data analysis
Author:
Affiliation:
1. Peter Grünberg Institut (PGI-3), Forschungszentrum Jülich and JARA-Fundamentals of Future Information Technology, 52425 Jülich, Germany
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.5042346
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1. Anisotropy in Conductance of a Quasi-One-Dimensional Metallic Surface State Measured by a Square Micro-Four-Point Probe Method
2. Electrical Resistance of a Monatomic Step on a Crystal Surface
3. Dual-probe scanning tunneling microscope: Measuring a carbon nanotube ring transistor
4. Direct measurement of the direction of interface motion in the oxidation of metals and covalent solids—Al(111) and Si(100) oxidation with O2 at 300 K
5. Low resistivity of Pt silicide nanowires measured using double-scanning-probe tunneling microscope
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