Low resistivity of Pt silicide nanowires measured using double-scanning-probe tunneling microscope-Reference-Cited by-同舟云学术

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Low resistivity of Pt silicide nanowires measured using double-scanning-probe tunneling microscope

Published:2008-05-19 Issue:20 Volume:92 Page:203114
ISSN:0003-6951
Container-title:Applied Physics Letters
language:en
Short-container-title:Appl. Phys. Lett.

Author:

Lim Do Kyung,Kubo Osamu,Shingaya Yoshitaka,Nakayama Tomonobu,Kim Young Heon,Lee Jeong Yong,Aono Masakazu,Lee Hangil,Lee Dohyun,Kim Sehun

Publisher

AIP Publishing

Subject

Physics and Astronomy (miscellaneous)

Link

http://aip.scitation.org/doi/pdf/10.1063/1.2935329

Reference27 articles.

1. Luttinger-liquid behaviour in carbon nanotubes

2. Ferromagnetism in one-dimensional monatomic metal chains

3. Self-assembled growth of epitaxial erbium disilicide nanowires on silicon (001)

4. Self-assembled rare-earth silicide nanowires on Si(001)

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1. Vapor phase synthesis of topological semimetal MoP₂ nanowires and their resistivity;Applied Physics Letters;2022-09-12

2. Invited Review Article: Multi-tip scanning tunneling microscopy: Experimental techniques and data analysis;Review of Scientific Instruments;2018-10

3. Structural Analysis of Self-Assembled Platinum-Silicide Nanostructures on Si(001) Using Ion Scattering Spectroscopy;e-Journal of Surface Science and Nanotechnology;2018

4. Kinetic properties of the two-dimensional conducting system formed by CrSi2 nanocrystallites in plane (111) of silicon;physica status solidi (b);2013-10-18

5. Metallic rare-earth silicide nanowires on silicon surfaces;Journal of Physics: Condensed Matter;2012-12-05

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