Multiprobe Electrical Measurements without Optical Interference
Author:
Affiliation:
1. Nanonics Imaging Ltd. Har Hotzvim Hi-Tech Park Beit Bynet; 19 Hartum St. Jerusalem 97775 Israel
Publisher
Wiley-VCH Verlag GmbH & Co. KGaA
Link
http://onlinelibrary.wiley.com/wol1/doi/10.1002/9783527699773.ch13/fullpdf
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3. An ultrahigh vacuum dual-tip scanning tunneling microscope operating at 4.2 K;Okamoto;Rev. Sci. Instrum.,2001
4. Development and performance of the nanoworkbench: a four tip STM for conductivity measurements down to sub micrometer scales;Guise;Rev. Sci. Instrum.,2005
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