Measurement of propagation of ultrafast surface plasmon polariton pulses using dual-probe scanning near-field optical microscopy-Reference-Cited by-同舟云学术

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Measurement of propagation of ultrafast surface plasmon polariton pulses using dual-probe scanning near-field optical microscopy

Published:2019-07-12 Issue:21 Volume:58 Page:5595
ISSN:1559-128X
Container-title:Applied Optics
language:en
Short-container-title:Appl. Opt.

Author:

Masaki Yuta,Tomita Keita,Kojima Yasuhiro,Kannari Fumihiko

Funder

Ministry of Education, Culture, Sports, Science and Technology (MEXT)

Publisher

The Optical Society

Subject

Atomic and Molecular Physics, and Optics,Engineering (miscellaneous),Electrical and Electronic Engineering

Reference29 articles.

1. Independently driven four-tip probes for conductivity measurements in ultrahigh vacuum

2. Stability, resolution, and tip–tip imaging by a dual-probe scanning tunneling microscope

3. An ultrahigh vacuum dual-tip scanning tunneling microscope operating at 4.2 K

4. Development and performance of the nanoworkbench: A four tip STM for conductivity measurements down to submicrometer scales

5. Four-probe scanning tunnelling microscope with atomic resolution for electrical and electro-optical property measurements of nanosystems

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1. Focusing of mid-infrared polaritons through patterned graphene on van der Waals crystals;Nanophotonics;2024-04-15

2. High-detection-efficiency stereo microscope system based on a mobile phone;Applied Optics;2023-06-26

3. Laser-combined multiprobe microscopy and its application to the materials with atomic layer thickness;Japanese Journal of Applied Physics;2022-06-23

4. Scanning near-field optical spectroscopy and carrier transport based analysis in mesoscopic regions for two-dimensional semiconductors;Scientific Reports;2022-06-20

5. Investigation of dipole emission near a dielectric metasurface using a dual-tip scanning near-field optical microscope;Nanophotonics;2021-10-22

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