Determination of the Twist Angle of GaN Film by High Resolution X-ray Diffraction
Author:
Publisher
IOP Publishing
Subject
General Physics and Astronomy,General Engineering
Link
http://stacks.iop.org/1882-0786/1/i=4/a=045004/pdf
Reference16 articles.
1. Library
2. Defect structure of epitaxial GaN films determined by transmission electron microscopy and triple-axis X-ray diffractometry
3. Microstructure of heteroepitaxial GaN revealed by x-ray diffraction
4. X-ray diffraction peak profiles from threading dislocations in GaN epitaxial films
5. Determination of the azimuthal orientational spread of GaN films by x-ray diffraction
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