Strain Stability and Carrier Mobility Enhancement in Strained Si on Relaxed SiGe-on-Insulator

Author:

Ma Xiaobo,Liu Weili,Liu Xuyan,Du Xiaofeng,Song Zhitang,Lin Chenglu,Chu Paul K.

Publisher

The Electrochemical Society

Subject

Materials Chemistry,Electrochemistry,Surfaces, Coatings and Films,Condensed Matter Physics,Renewable Energy, Sustainability and the Environment,Electronic, Optical and Magnetic Materials

Cited by 6 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Two-step hydrogen-ion implantation annihilation of threading dislocation defects in strain-relaxed Si0.7Ge0.3;Journal of the Korean Physical Society;2021-11-30

2. Impact of strained channel on electrical properties of Junctionless Double Gate MOSFET;Journal of Physics: Conference Series;2020-03-01

3. New strategies for producing defect free SiGe strained nanolayers;Scientific Reports;2018-02-13

4. Direct band gap optical emission from Ge islands grown on relaxed Si0.5Ge0.5/Si (100) substrate;Journal of Applied Physics;2014-01-07

5. Modified postannealing of the Ge condensation process for better-strained Si material and devices;Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena;2010-09

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