Sputtering Effect on Amorphous Ga–In–Zn–O Thin-Film Surface: Occurrence of Subgap and Metallic States-Reference-Cited by-同舟云学术

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Sputtering Effect on Amorphous Ga–In–Zn–O Thin-Film Surface: Occurrence of Subgap and Metallic States

Published:2010 Issue:12 Volume:13 Page:H454
ISSN:1099-0062
Container-title:Electrochemical and Solid-State Letters
language:en
Short-container-title:Electrochem. Solid-State Lett.

Author:

Lee Mi Ji,Kang Se-Jun,Baik Jae Yoon,Kim Ki-Jeong,Kim Hyeong-Do,Shin Hyun-Joon,Chung JaeGwan,Lee Eunha,Lee Jaecheol,Lee JaeHak

Publisher

The Electrochemical Society

Subject

Electrical and Electronic Engineering,Electrochemistry,Physical and Theoretical Chemistry,General Materials Science,General Chemical Engineering

Reference10 articles.

1. Thin-Film Transistor Fabricated in Single-Crystalline Transparent Oxide Semiconductor

2. Room-temperature fabrication of transparent flexible thin-film transistors using amorphous oxide semiconductors

3. Ionic amorphous oxide semiconductors: Material design, carrier transport, and device application

4. High-performance amorphous gallium indium zinc oxide thin-film transistors through N2O plasma passivation

5. Improvements in the device characteristics of amorphous indium gallium zinc oxide thin-film transistors by Ar plasma treatment

Cited by 8 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Investigation of intrinsic electrical properties of cerium doped lithium cobalt oxide, nanostructured materials;AIP Advances;2018-11

2. Investigation of O2- and Air-Exposure Effects on Amorphous In–Ga–Zn–O Thin-Film Surface by X-ray Photoelectron Spectroscopy;Journal of Inorganic and Organometallic Polymers and Materials;2013-08-07

3. Hall mobility manipulation in TiO2−x semiconductor films by hydrogen-ion irradiation;Journal of the Korean Physical Society;2013-03

4. Thin-film transistor behaviour and the associated physical origin of water-annealed In–Ga–Zn oxide semiconductor;Journal of Physics D: Applied Physics;2012-09-28

5. Blue shift in the optical band gap of amorphous Hf–In–Zn–O thin films deposited by RF sputtering;Journal of Alloys and Compounds;2012-06

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