EBL2 an EUV (Extreme Ultra-Violet) lithography beam line irradiation facility-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

EBL2 an EUV (Extreme Ultra-Violet) lithography beam line irradiation facility

Published:2019-09-26 Issue: Volume: Page:
ISSN:
Container-title:International Conference on Extreme Ultraviolet Lithography 2019
language:
Short-container-title:

Author:

Bekman Herman H. P. Th.,Dekker Michael,Ebeling Robert,Janssen Jochem,Koster Norbert,Meijlink Joop,Molkenboer Freek T.,Nicolai Kyri,van Putten Michel,Rijnsent Corné,Storm Arnold,Stortelder Jetske,Wu Chien-Ching,de Zanger Rory

Publisher

SPIE

Reference9 articles.

1. EBL2: high power EUV exposure facility;te Sligte,2016

2. EBL2: high power EUV exposure facility

3. First light and results on EBL2;Koster,2017

4. Progress on EUV pellicle development;Zoldesi,2014

5. Progress in EUV lithography toward manufacturing;Kim,2017

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Measurements of ion fluxes in extreme ultraviolet-induced plasma of new EUV-beam-line 2 nanolithography research machine and their applications for optical component tests;Journal of Vacuum Science & Technology B;2023-01-01

2. First results of EUV-scanner compatibility tests performed on novel 'high-NA' reticle absorber materials;International Conference on Extreme Ultraviolet Lithography 2021;2021-10-12

3. Low-Energy Plasma Source for Clean Vacuum Environments: EUV Lithography and Optical Mirrors Cleaning;IEEE Transactions on Plasma Science;2021-10

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP