A 10 nsec Resolution Counter for Multiparticle Atom Probe Time‐of‐Flight Measurements-Reference-Cited by-同舟云学术

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A 10 nsec Resolution Counter for Multiparticle Atom Probe Time‐of‐Flight Measurements

Published:1973-05 Issue:5 Volume:44 Page:592-594
ISSN:0034-6748
Container-title:Review of Scientific Instruments
language:en
Short-container-title:Review of Scientific Instruments

Author:

Berger A. S.

Publisher

AIP Publishing

Subject

Instrumentation

Link

http://aip.scitation.org/doi/pdf/10.1063/1.1686190

Reference3 articles.

1. The Atom‐Probe Field Ion Microscope

2. ON THE IONIZATION STATE OF FIELD EVAPORATED ATOMS AS MEASURED IN THE FIM‐ATOM PROBE

Cited by 19 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. EFFECT OF FIELD-EVAPORATION RATE ON QUANTITATIVE ATOM-PROBE ANALYSIS;Le Journal de Physique Colloques;1986-03

2. An automatic control and timing unit for a time-of-flight mass spectrometer;Journal of Physics E: Scientific Instruments;1983-12

3. A study of the composition of the {111} planes of GaP on an atomic scale;Surface Science;1982-06

4. A versatile time-of-flight atom probe for metallurgical applications;Surface and Interface Analysis;1979-10

5. A differentially pumped low‐energy ion beam system for an ultrahigh‐vacuum atom‐probe field‐ion microscope;Review of Scientific Instruments;1979-09

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